|
326| 0
|
Investigation of Surge Current Reliability of 1200V Planar and Trench SiC MO...TA的其它主题 |
上一篇：High Temperature Gate Voltage Step-by-Step Test to Assess Reliability Differ... 下一篇：Practical Aspects and Body Diode Robustness of a 1200V SiC Trench MOSFET | ||
扫一扫，关注我们
关注微信公众号：电力电子技术与新能源 关注我们，每天有惊喜，每日有活动，扫描左边二维码，即可关注，你还在等什么？ |
GMT+8, 2024-11-5 18:46 , Processed in 0.127383 second(s), 26 queries .
Powered by Discuz! X3.4
© 2001-2017 Comsenz Inc.
发表于 2023-5-24 00:03:46
